Hsiao named an IEEE Fellow | ECE | Virginia Tech


Hsiao named an IEEE Fellow

Michael Hsiao

Michael Hsiao

December 3, 2012 — ECE's Michael Hsiao has been named an IEEE Fellow for his contributions to the automatic test pattern generation of integrated circuits.

The status of Fellow is one of the most prestigious honors of the institute, bestowed upon less than one-tenth of one percent of the annual voting membership of IEEE.

Among his other achievements, Hsiao has received the National Science Foundation Faculty Early Career Development (CAREER) award, the 2010 Best Paper Award at the Asian Test Symposium, and the Virginia Tech College of Engineering Dean's Faculty Fellow Award. He is currently serving as an associate editor for IEEE Transactions on Computers and ACM Transactions on Design Automation of Electronic Systems.

Hsiao is a member of the Center for Embedded Systems for Critical Applications (CESCA) research group at Virginia Tech. His research interests include design verification and diagnosis, fault simulation and defect coverage evaluation, design for testability (DFT), test set compaction, and power estimation and management in VLSI.

Hsiao joined the Virginia Tech faculty in 2001. He received his B.S. in Computer Engineering and his M.S. and Ph.D. in Electrical Engineering, all from the University of Illinois at Urbana-Champaign.